The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1995
Filed:
Sep. 21, 1993
Peter C Walters, Bowen Island, CA;
Patrice Gamand, Yerres, FR;
U.S. Philips Corporation, New York, NY (US);
Abstract
A calibration device is disclosed for hyper-frequency adjustment of the reference planes of an apparatus for measuring the dispersion parameters of elements of circuits integrated on a substrate. The device includes, integrated on the same substrate, standard patterns and accesses to these patterns which are compatible with the contacts of two test probes connected to the apparatus. Also provided on the substrate are at least two identical series of standard patterns which are formed by parallel lines of the same length, including a short-circuit line and/or an open line and/or a load line, whose accesses are aligned within each series, but opposed from one series to another with respect to the zone in which the second ends are situated. Their second ends are aligned within each series, defining the facing reference planes, separated by a given distance d. The second ends are also arranged in an offset manner from one series to the other in the plane of the substrate by translations parallel to the reference planes so that the distance between these offset ends is equal to or greater than twice the thickness of the substrate and the distance d separating the reference planes is approximately equal to or smaller than three times the thickness of the substrate.