Peter C De Jong

Title: Innovations of Peter C De Jong

Introduction

Peter C De Jong is a notable inventor based in Arnhem, Netherlands. He has made significant contributions to the field of integrated circuit testing. His work focuses on enhancing the reliability and performance of electronic devices.

Latest Patents

One of his key patents is titled "Method and apparatus for testing integrated circuits for susceptibility to latch-up." This invention presents a test module designed to assess the susceptibility of integrated circuit designs to latch-up. The test module consists of multiple test blocks connected in parallel. Each test block features an injector block that applies a stress current or voltage, along with several sensor blocks positioned at increasing distances from the injector block. Each sensor block incorporates a PNPN latch-up test structure. This innovative approach combines the benefits of IC stress current testing with latch-up parameter measurement using a standard PNPN latch-up test structure.

Career Highlights

Peter C De Jong is associated with NXP B.V., a leading company in the semiconductor industry. His work at NXP has allowed him to contribute to advancements in integrated circuit technology. His patent reflects his commitment to improving the reliability of electronic components.

Collaborations

Peter has collaborated with notable colleagues, including Taede Smedes and Paul Hendrik Cappon. Their combined expertise has furthered the development of innovative solutions in the field of integrated circuits.

Conclusion

Peter C De Jong's contributions to integrated circuit testing demonstrate his innovative spirit and dedication to advancing technology. His patent showcases a significant step forward in ensuring the reliability of electronic devices.