The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jul. 27, 2006
Andrea Scarpa, Wijchen, NL;
Paul H. Cappon, Wijchen, NL;
Peter C. DE Jong, Arnhem, NL;
Taede Smedes, Beuningen, NL;
Andrea Scarpa, Wijchen, NL;
Paul H. Cappon, Wijchen, NL;
Peter C. De Jong, Arnhem, NL;
Taede Smedes, Beuningen, NL;
NXP B.V., Eindhoven, NL;
Abstract
In an example embodiment, there is a test module for testing the susceptibility of an integrated circuit design to latch-up. The test module comprises a plurality of test blocks, connected in parallel. Each test block includes an injector block for applying a stress current of voltage to the respective test block and a plurality of sensor blocks located at successively increasing distances from the respective injector block. Each sensor block includes a PNPN latch-up test structure. The present invention combines the respective advantages of IC stress current testing and latch-up parameter measurement using a standard PNPN latch-up test structure.