Basel, Switzerland

Per Rigler

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Biophos Ag. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Per Rigler. Retrieved from https://idiyas.com/inventor/per-rigler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Per Rigler - Innovator in Particle Measurement Technology

Introduction

Per Rigler is a notable inventor based in Basel, Switzerland. He has made significant contributions to the field of particle measurement technology. His innovative approach has led to the development of a unique method and device that enhances the understanding of dynamic parameters of particles.

Latest Patents

Per Rigler holds a patent for a "Method and device for measuring dynamic parameters of particles." This invention involves applying time correlation analysis on the fluctuations of particles concerning a detection area of a digital picture. This advancement has the potential to improve various applications in scientific research and industry.

Career Highlights

Per Rigler is associated with Biophos AG, where he continues to work on innovative solutions in the field of particle measurement. His expertise and dedication to research have positioned him as a key figure in his company.

Collaborations

Per Rigler collaborates with Rudolf Rigler, who is also a prominent figure in the field. Their partnership has fostered advancements in research and development, contributing to the growth of innovative technologies.

Conclusion

Per Rigler's work exemplifies the spirit of innovation in the scientific community. His contributions to particle measurement technology are paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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