The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Jan. 17, 2006
Applicants:
Rudolf Rigler, St-Sulpice, CH;
Per Rigler, Basel, CH;
Lennart Nilsson, Älvsjö{umlaut over ( )}, SE;
Inventors:
Assignee:
Biophos AG, Wollerau, CH;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 31/00 (2006.01); G01N 15/02 (2006.01); G01F 1/712 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a method and device for measuring dynamic parameters of particles comprises applying time correlation analysis on fluctuation of the particles with respect to a detection area of a digital picture.
Rigler, Rudolf. (2011). Method and device for measuring dynamic parameters of particles (U.S. Patent No. 7912274). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7912274
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile