This inventor holds 1 USPTO granted patent. Top assignee: Bentley Systems, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Peng Yin and Structural Load Identification
Introduction
Peng Yin is an inventor associated with Ladera Ranch, California, and Bentley Systems, Inc. His patent work addresses methods for identifying external loads acting on structures by calibrating finite element models against measured structural responses.
Latest Patents
The provided information lists one patent for Peng Yin: Finite Element Calibration for Structural Load Identification. The invention describes a two-stage approach. First, material or geometric attributes in a structural model are adjusted to reduce differences between measured and modeled responses. The calibrated model is then used to identify external structural loads that further minimize those differences.
The method can evaluate dynamic and static responses. It may use a genetic algorithm to propose sets of loads, apply them to the model, calculate an error function, and iteratively refine the proposed solutions until a stopping criterion is met. This approach is intended to improve the identification of loads from observed structural behavior. Yin is credited with 1 patent in the information provided.
Career Highlights
Yin’s listed patent connects his work with structural analysis and computational modeling. The disclosed technique combines finite element model calibration with an optimization process for estimating external loads.
Collaborations
The information provided identifies Bentley Systems, Inc. as Yin’s company and names Zheng Yi Wu and Wael Elhaddad as coworkers. These details indicate professional associations, though no specific roles in the patent are stated.
Conclusion
Peng Yin’s listed invention presents a model-based method for estimating structural loads by reducing discrepancies between measured and simulated responses.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
