The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Jul. 17, 2020
Applicant:

Bentley Systems, Incorporated, Exton, PA (US);

Inventors:

Zheng Yi Wu, Watertown, CT (US);

Peng Yin, Ladera Ranch, CA (US);

Wael Elhaddad, Hercules, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/23 (2020.01); G01N 3/02 (2006.01); G06F 3/14 (2006.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/23 (2020.01); G01N 3/02 (2013.01); G06F 3/14 (2013.01); G06F 2111/10 (2020.01);
Abstract

In various example embodiments, model calibration techniques are used to identify one or more external structural loads on a structure. Initially, material or geometry attributes of elements of a model are adjusted to minimize discrepancy between measured responses and modeled responses. Thereafter, the model is used to search for external structural loads that minimize discrepancy between the measured responses and the modeled responses. Discrepancy may be measured by an error function that looks to dynamic responses and/or static responses. A solution that minimizes discrepancy may be determined using a genetic algorithm that generates a set of proposed external structural loads, applies the set to the model to produce the modeled responses, computes an error function that measures the difference between the measured responses and the modeled responses, and evolves the solutions to minimize an error produced by the error function, with such operation proceeding until a stopping criteria is reached.


Find Patent Forward Citations

Wu, Zheng. (2026). Finite element calibration for structural load identification (U.S. Patent No. 12670301). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12670301

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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