Company Filing History:
Years Active: 2016
Title: Innovations of Peng Jui-Chun in Semiconductor Fabrication
Introduction
Peng Jui-Chun is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor fabrication, particularly in the detection of defects on wafers. His innovative approach has the potential to enhance the efficiency and accuracy of semiconductor manufacturing processes.
Latest Patents
Peng Jui-Chun holds a patent for the "Detection of defects on wafer during semiconductor fabrication." This patent outlines systems and techniques for detecting defects on a wafer based on non-correctable error data obtained from a scan of the wafer. The process involves reconstructing the non-correctable error data to create a non-correctable error image map, which is then transformed to generate a projection. In certain embodiments, the image map is transformed using feature extraction techniques such as the Hough transform or Radon transform. The projection is compared to a set of rules to identify signatures in the image map that indicate defects.
Career Highlights
Peng Jui-Chun is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work focuses on improving the reliability and quality of semiconductor products through innovative detection methods.
Collaborations
He has collaborated with notable colleagues, including Chun-Hsien Lin and Liu Bo-Tsun, to advance research and development in semiconductor technologies.
Conclusion
Peng Jui-Chun's contributions to semiconductor fabrication through his innovative patent demonstrate his commitment to enhancing manufacturing processes. His work is vital for the ongoing evolution of the semiconductor industry.