Beijing, China

Peizhi Jia

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Beijing Jiaotong University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peizhi Jia. Retrieved from https://idiyas.com/inventor/peizhi-jia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Peizhi Jia: Innovator in Multi-DOF Measurement Technologies

Introduction

Peizhi Jia is a prominent inventor based in Beijing, China. He has made significant contributions to the field of measurement technologies, particularly in the area of multi-degree-of-freedom (DOF) measurements. His innovative work has led to the development of a unique method and system that enhances the accuracy and efficiency of measuring spatial objects.

Latest Patents

Peizhi Jia holds a patent for a method titled "Method for simultaneously measuring multi DOF GEs by laser and system therefor." This invention provides a comprehensive solution for simultaneously measuring multiple DOF geometric entities (GEs) using laser technology. The system consists of a measuring unit and a target mirror unit. The measuring unit includes a laser emitting module, a polarizing beam splitter, a fixed reflector, two λ/4 wave plates, a polarizer, a photodetector, an interference length measuring module, and a 2D angle measuring module. The target mirror unit is equipped with a beam splitter and a reflector. This innovative system allows for rapid measurement of 5/6 DOF GEs of a space object moving linearly along a linear axis, enabling long-term monitoring of the relative drift in position and attitude of two objects with 5/6 DOF in space.

Career Highlights

Peizhi Jia is affiliated with Beijing Jiaotong University, where he continues to advance research in measurement technologies. His work has garnered attention for its practical applications in various fields, including aerospace and robotics. With a focus on precision and efficiency, Jia's contributions are paving the way for future innovations in measurement systems.

Collaborations

Peizhi Jia has collaborated with notable colleagues, including Qibo Feng and Fajia Zheng. Their combined expertise has further enhanced the development and application of innovative measurement technologies.

Conclusion

Peizhi Jia's work exemplifies the spirit of innovation in the field of measurement technologies. His patented method for measuring multi DOF GEs by laser represents a significant advancement that can impact various industries. Through his contributions, Jia continues to inspire future generations of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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