The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Nov. 07, 2022
Beijing Jiaotong University, Beijing, CN;
Qibo Feng, Beijing, CN;
Fajia Zheng, Beijing, CN;
Jiakun Li, Beijing, CN;
Bin Zhang, Beijing, CN;
Jing Yang, Beijing, CN;
Yuqiong Zhao, Beijing, CN;
Peizhi Jia, Beijing, CN;
BEIJING JIAOTONG UNIVERSITY, Beijing, CN;
Abstract
A method and system for simultaneously measuring multiple DOF GEs by a laser. The system comprises a measuring unit and a target mirror unit; the measuring unit comprises a laser emitting module, a polarizing beam splitter, a fixed reflector, a first λ/4 wave plate, a second λ/4 wave plate, a first polarizer, a first photodetector, an interference length measuring module and a 2D angle measuring module. The target mirror unit comprises a beam splitter and a reflector. The laser emitting module generates an emitting light L. The polarizing beam splitter is used for (1) beam splitting, (2) beam combining, and (3) beam separating. The fixed reflector is used for reflecting backward the reference light Lpropagating only inside the measuring unit to return the reference light Lto the polarizing beam splitter. The present invention can realize a simultaneous and rapid measurement of 5/6DOF GEs of a space object moving linearly along a linear axis; and a relative drift of position and attitude of two objects with 5/6DOF in a space can be longtime monitored.