Pleasanton, CA, United States of America

Peigeng Li

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: 10X Genomics, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peigeng Li. Retrieved from https://idiyas.com/inventor/peigeng-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Peigeng Li and Image Registration for Spatial Biology

Introduction

Peigeng Li is an inventor based in Pleasanton, California, and is associated with 10x Genomics, Inc. His patent work addresses image registration, a process that aligns images with spatial data to support analysis of biological samples.

Latest Patents

Li is named on 1 patent, titled “Systems and Methods for Image Registration or Alignment.” The invention describes overlaying an image of a biological sample onto spatial analyte data. It uses patterns visible in two images of the sample to determine their registration, while spatial fiducials establish the spatial dataset’s frame of reference. The aligned image can then be overlaid on analyte data associated with capture spots, helping connect visual sample information with spatial measurements.

Career Highlights

Li’s listed patent reflects work at the intersection of image processing and spatial biology. The disclosed method is designed to align sample images with spatial datasets, using transparent substrates, fiducials, and capture spots as part of the process.

Collaborations

Li’s listed coworker is Olga Vorobyova. The available information identifies both as connected to the patent record but does not specify their respective roles or the details of their collaboration.

Conclusion

Peigeng Li’s patent focuses on aligning biological sample images with spatial analyte data, linking visual patterns to measurements at defined capture spots.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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