The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Sep. 16, 2022
10x Genomics, Inc., Pleasanton, CA (US);
Olga Vorobyova, Pleasanton, CA (US);
Brynn Claypoole, Pleasanton, CA (US);
Dongyao Li, Pleasanton, CA (US);
Neil Ira Weisenfeld, Pleasanton, CA (US);
Didem Pelin Sarikaya, Pleasanton, CA (US);
Peigeng Li, Pleasanton, CA (US);
Guy Joseph, Pleasanton, CA (US);
Eric Siegel, Pleasanton, CA (US);
Naga Sudha Kodavatikanti, Cupertino, CA (US);
10x Genomics, Inc., Pleasanton, CA (US);
Abstract
Systems and methods for overlaying image data for a biological sample on spatial analyte data are provided. A first image of the sample on a first substrate and a second image of the sample on the first substrate overlayed on a second substrate are obtained. The second substrate includes spatial fiducials and capture spots. At least one of the first substrate and the second substrate is transparent. A registration for the first image and the second image is determined, using a first pattern of the sample in the first image and a second pattern of the sample in the second image. The registration is used to overlay the first image onto a spatial dataset including spatial analyte data for the capture spots from the sample. A frame of reference of the spatial dataset is known with respect to the second image, based on the spatial fiducials of the second image.