This inventor holds 2 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignee: Fei Comapny. Active years: 2017-2021.
Company Filing History:
Years Active: 2017-2021
Title: Innovations by Pavel Poloucek
Introduction
Pavel Poloucek is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of charged particle microscopy through his innovative patents. With a total of 2 patents, his work showcases advancements in sample manipulation and specimen holding techniques.
Latest Patents
One of his latest patents is titled "Method of manipulating a sample in an evacuated chamber of a charged particle apparatus." This invention relates to a method of manipulating a sample within an evacuated chamber, which includes several steps such as providing a sample on a substrate, bringing a manipulator in contact with the sample, and utilizing carbon nanotubes for attachment. Another significant patent is the "Specimen holder for a charged particle microscope." This invention features a support structure with a rotor that allows specimens to be rotated and inverted for microscopic observation, enhancing the capabilities of charged particle microscopes.
Career Highlights
Pavel Poloucek is associated with FEI Company, where he applies his expertise in developing advanced microscopy techniques. His work has been instrumental in improving the functionality and efficiency of charged particle microscopes.
Conclusion
Pavel Poloucek's contributions to the field of charged particle microscopy through his innovative patents demonstrate his commitment to advancing technology in this area. His inventions are paving the way for enhanced microscopic observation techniques.