Bridgewater, NJ, United States of America

Paul William Rutkowski


Average Co-Inventor Count = 2.1

ph-index = 3

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 1997-2006

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4 patents (USPTO):Explore Patents

Title: The Innovations of Paul William Rutkowski

Introduction

Paul William Rutkowski is a notable inventor based in Bridgewater, NJ (US). He has made significant contributions to the field of integrated circuits, holding a total of 4 patents. His work focuses on enhancing the efficiency and effectiveness of built-in self-test (BIST) networks.

Latest Patents

Rutkowski's latest patents include a built-in self-test hierarchy for an integrated circuit. This invention employs a hierarchy of Universal BIST schedulers (UBSs) for scheduling and coordinating testing of elements, such as regular structure BISTed (RSB) elements and random logic BISTed (RLB) elements. The design allows for minimized effects of delay and clock skew by utilizing short interconnect routing between BISTed elements. Additionally, he has developed a built-in self-test controlled by a token network and method. This invention relates to a token passing network, called a Universal BIST Scheduler (UBS), which optimizes the efficiency of continuous processing in BISTed memory elements.

Career Highlights

Throughout his career, Rutkowski has worked with prominent companies such as Lucent Technologies Inc. and Agere Systems Inc. His experience in these organizations has contributed to his expertise in integrated circuit design and testing methodologies.

Collaborations

Rutkowski has collaborated with notable professionals in the field, including Ilyoung Kim and Yervant Zorian. These collaborations have further enriched his work and innovations in integrated circuit technology.

Conclusion

Paul William Rutkowski's contributions to the field of integrated circuits through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the efficiency of testing methodologies in modern technology.

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