The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 1997
Filed:
Jul. 02, 1996
Paul W Rutkowski, Bridgewater, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
Partial-Scan testing of an integrated circuit (10) having a Boundary-Scan architecture (18) is accomplished by way of a Partial-Scan controller (36) contained within the integrated circuit. In response to control signals generated by Boundary-Scan architecture (18), the Partial-Scan controller (36) generates a set of Partial-Scan control signals for causing the integrated circuit to accomplish Partial-Scan testing. In this way, the Partial-Scan control signals necessary to accomplish Partial-Scan testing are generated internally, rather than requiring a separate set of input pins to receive the Partial-Scan control signals from an external source.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile