San Jose, CA, United States of America

Paul Wieczorek

USPTO Granted Patents = 2 

Average Co-Inventor Count = 7.2

ph-index = 2

Forward Citations = 195(Granted Patents)


Company Filing History:


Years Active: 1996-2008

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Paul Wieczorek: Innovator in Charged Particle Measurement Systems

Introduction

Paul Wieczorek is a notable inventor based in San Jose, CA, with a focus on innovations in measurement systems. He holds 2 patents that contribute significantly to the field of charged particle analysis. His work emphasizes the importance of minimizing specimen alteration during analysis, which is crucial for accurate measurements.

Latest Patents

Wieczorek's latest patents include "Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systems." This patent describes a system that utilizes a vacuum chamber to prevent alteration of a specimen's characteristics during analysis. The system features a cooled element that adsorbs molecules in the vacuum chamber, ensuring the integrity of the specimen. Another significant patent is for an "Electron beam inspection system and method," which outlines a particle scanning system that directs a particle beam at a substrate's surface. This system includes various detectors and an x-y stage for precise scanning, along with a vacuum mechanism for efficient substrate handling.

Career Highlights

Throughout his career, Paul Wieczorek has worked with prominent companies such as KLA Instruments Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in measurement systems.

Collaborations

Wieczorek has collaborated with notable colleagues, including Dan Meisburger and Alan D Brodie. These partnerships have likely contributed to the advancement of his inventions and the successful implementation of his patented technologies.

Conclusion

Paul Wieczorek's contributions to the field of charged particle measurement systems demonstrate his commitment to innovation and accuracy in scientific analysis. His patents reflect a deep understanding of the challenges in specimen analysis and provide solutions that enhance measurement reliability.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…