Paul H Bardell, Jr

Title: Paul H Bardell, Jr: Innovator in Logic Testing and Diagnosis

Introduction

Paul H Bardell, Jr is a notable inventor based in Carmel, NY (US). He has made significant contributions to the field of logic testing and diagnosis, holding a total of 4 patents. His work primarily focuses on enhancing the reliability and efficiency of electronic products.

Latest Patents

One of his latest patents is related to the "Test and diagnosis of associated output logic for products having embedded arrays." This invention addresses the challenges of testing and diagnosing failures in the post-logic of products with embedded arrays. The method involves initializing the array to random values, selecting addresses, and reading out information while applying random signals at primary inputs. This process is repeated for various addresses, allowing for effective fault diagnosis through a notebook that retains the history of chosen addresses.

Another significant patent is for "Reduced delay circuits for shift register latch scan strings." This invention eliminates delays in critical signal paths by employing level-sensitive scan design methods for self-test operations. It segregates scan strings associated with primary input lines and supplies them to a distinct signature register, simplifying the degating circuitry on the input side of shift register latches.

Career Highlights

Paul H Bardell, Jr has had a distinguished career at International Business Machines Corporation (IBM). His innovative work has contributed to advancements in electronic testing and diagnostics, making him a valuable asset to the company.

Collaborations

Throughout his career, he has collaborated with notable coworkers such as William H McAnney and Jacob Savir. These collaborations have further enhanced the impact of his inventions in the field.

Conclusion

Paul H Bardell, Jr is a prominent inventor whose work in logic testing and diagnosis has significantly advanced the field of electronics. His contributions continue to influence the industry and improve product reliability.