The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 1990

Filed:

Dec. 09, 1988
Applicant:
Inventor:

Paul H Bardell, Jr, Carmel, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 27 ; 364717 ;
Abstract

Phase enhancement means are employed in conjunction with linear feedback shift registers to generate sequences of binary pattern vectors which are much more structurally independent of one another thus enabling more thorough and comprehensive testing of integrated circuit systems. More particularly, the present invention employs a plurality of exclusive-OR gates in an array of one gate per register output cell to generate the desired uncorrelated pattern strings. This facilitates testing of integrated circuit devices and systems and is particularly useful for built-in test situations for very large scale integrated circuits which employ pseudorandom test methods.


Find Patent Forward Citations

Bardell, Jr, Paul. (1990). Parallel pseudorandom pattern generator with varying phase shift (U.S. Patent No. 4959832). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4959832

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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