Company Filing History:
Years Active: 1988-1997
Title: Paul Esrig: Innovator in Optical Emission Microscopy
Introduction
Paul Esrig is a notable inventor based in Saratoga, CA (US). He has made significant contributions to the field of optical emission microscopy, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
Esrig's latest patents include a "Method and apparatus for detecting non-uniformities in reflective surfaces." This invention involves an electro-luminescent panel that provides uniform illumination for inspecting planar objects, such as silicon wafers. The system includes a camera positioned to detect light reflected from the surface, generating outputs that indicate surface uniformity. Additionally, he has developed an "Emission microscopy system," which features a macro optic system with a high numerical aperture. This system allows for global views of integrated circuits, enabling operators to identify defects and zoom in for detailed inspections.
Career Highlights
Paul Esrig is currently associated with Kla Instruments Corporation, where he continues to push the boundaries of innovation in his field. His work has been instrumental in advancing the capabilities of optical inspection systems.
Collaborations
Esrig has collaborated with notable colleagues, including Eliezer Rosengaus and Ezra Van Gelder, contributing to a dynamic work environment that fosters innovation.
Conclusion
Paul Esrig's contributions to optical emission microscopy and his innovative patents reflect his commitment to advancing technology. His work continues to impact the field significantly.