This inventor holds 2 USPTO granted patents, plus 1 CIPO patent. Top assignees: Jireh Industries Ltd., Metalogic Inspection Services Inc. Active years: 2012-2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012-2014
Title: Paul E Torstensen: Innovator in Inspection Technology
Introduction
Paul E Torstensen is a notable inventor based in Ardrossan, California. He has made significant contributions to the field of inspection technology, holding a total of 2 patents. His innovative designs focus on enhancing the efficiency and effectiveness of inspection processes.
Latest Patents
Torstensen's latest patents include a "Modular Scanner Apparatus" and a "Probe Holding Apparatus for Inspection." This modular scanner consists of an assembly of multiple connective links that can be added or removed to fit the size of a tubular body being inspected. A tail link, biased by a spring, holds the assembly in place against the tubular body. Additionally, he developed a "Method and Apparatus for Conveying an Ultrasonic Sensor" around the outer peripheral surface of a tube. This method allows for non-destructive evaluation by moving the ultrasonic sensor through an arc while maintaining ultrasonic coupling with the tube.
Career Highlights
Throughout his career, Torstensen has worked with several companies, including Jireh Industries Ltd. and Metalogic Inspection Services Inc. His experience in these organizations has contributed to his expertise in inspection technologies and methodologies.
Collaborations
Some of his notable coworkers include Jason P Wiebe and Arthur J Dubbeldam. Their collaboration has likely fostered innovation and development in the projects they have undertaken together.
Conclusion
Paul E Torstensen's contributions to inspection technology through his patents and career experiences highlight his role as an influential inventor in this field. His work continues to impact the efficiency of inspection processes in various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile