The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Jun. 28, 2010
Applicants:

Arthur J. Dubbeldam, Ardrossan, CA;

Mark P. Dubbeldam, Ardrossan, CA;

Paul E. Torstensen, Ardrossan, CA;

Jason P. Wiebe, Edmonton, CA;

Inventors:

Arthur J. Dubbeldam, Ardrossan, CA;

Mark P. Dubbeldam, Ardrossan, CA;

Paul E. Torstensen, Ardrossan, CA;

Jason P. Wiebe, Edmonton, CA;

Assignee:

Jireh Industries Ltd., Ardrossan, Alberta, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a modular scanner and probe holding apparatus for inspection, which consists of an assembly of a plurality of connective links rigidly connected. The connective links are added or removed from the assembly to size the assembly so the assembly extends more than half way around a circumference of a tubular body to be inspected. At least one tail link is connected to an end of the assembly. The tail link is biased by a spring to apply a force against the tubular body to hold the assembly in place. A probe holder link is provided that connects to the connective links and has a probe holder for holding a probe.


Find Patent Forward Citations

Dubbeldam, Arthur. (2014). Modular scanner apparatus and probe holding apparatus for inspection (U.S. Patent No. 8646347). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8646347

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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