This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Global Storage Technologies Netherlands B.v.. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Paul Alejon Fontejon, Jr.: Inventor in Vacuum Plasma Processing
Introduction
Paul Alejon Fontejon, Jr. is an inventor associated with Pittsburg, California, and Hitachi Global Storage Technologies Netherlands B.V. His work includes a patent addressing particle contamination in vacuum plasma processing tools.
Latest Patents
The supplied information identifies one patent associated with Fontejon: “In-Situ Method to Reduce Particle Contamination in a Vacuum Plasma Processing Tool.” The invention describes an in-situ technique for reducing particle contamination while a wafer is inside a vacuum tool or deposition chamber. By performing decontamination within the processing equipment, the method can avoid the need for a separate device. It addresses particles that may originate from mechanical components within the tool and integrates decontamination into the vacuum process. The description also notes that performing the process in the presence of plasma under radio-frequency conditions may help maximize self-bias voltage.
Career Highlights
Fontejon’s listed patent reflects work on improving contamination control in semiconductor processing equipment. The supplied data associates him with Hitachi Global Storage Technologies Netherlands B.V. and records 1 patent.
Collaborations
Yinshi Liu and Ning Shi are identified as coworkers associated with Fontejon.
Conclusion
Paul Alejon Fontejon, Jr.’s documented invention focuses on reducing particle contamination directly within vacuum plasma processing equipment, integrating decontamination into the manufacturing process.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
