Winooski, VT, United States of America

Patrick W Miller

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Patrick W Miller. Retrieved from https://idiyas.com/inventor/patrick-w-miller

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Patrick W. Miller - Revolutionizing Microelectronic Device Verification

Introduction: Meet Patrick W. Miller, a brilliant inventor based in Winooski, VT, known for his groundbreaking work in the field of microelectronic device verification.

Latest Patents: Patrick W. Miller holds a remarkable patent titled "Integrated test structure and method for verification of microelectronic devices." This innovative test structure is designed to streamline the manufacturing verification process of microelectronic devices, particularly Digital to Analog Converters (DACs).

Career Highlights: Patrick W. Miller's professional journey is intertwined with technological advancements at International Business Machines Corporation (IBM). His relentless dedication to innovation has paved the way for cutting-edge solutions in the microelectronics industry.

Collaborations: Throughout his career, Patrick W. Miller has collaborated with esteemed professionals such as Raymond J. Bulaga and John K. Masi. Together, they have contributed to the development of sophisticated testing methodologies that have redefined the standards of microelectronic device verification.

Conclusion: Patrick W. Miller's ingenuity and expertise continue to drive innovation in the realm of microelectronics. His patent stands as a testament to his commitment to advancing technology and simplifying complex manufacturing processes. We look forward to witnessing more groundbreaking inventions from this visionary inventor.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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