The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2003
Filed:
Sep. 17, 2001
Raymond J. Bulaga, Richmond, VT (US);
John K. Masi, Milton, VT (US);
Patrick W. Miller, Winooski, VT (US);
Mark S. Styduhar, Hinesburg, VT (US);
Donald L. Wheater, Hinesburg, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An integrated test structure adapted to facilitate manufacturing verification of microelectronic devices such as Digital to Analog Converters (DAC) is disclosed. The test circuitry and the Circuit Under Test (CUT) are placed on an IC along with an arbitrary amount of digital logic, which drives the input of the CUT. These inputs are translated into an analog output. During a manufacturing test, this output is measured in order to determine that the IC has been manufactured correctly. The analog input of the circuit is coupled to the analog output of the DAC. The digital output of the test circuitry is coupled to the digital logic on the IC. This configuration comprises a Built In Self Test (BIST) structure. The invention allows BIST by eliminating the need to measure the analog output of the DAC external to the IC, and enables testing the CUT by using standard digital BIST techniques.