Patrick Schmidt

Title: The Innovations of Patrick Schmidt

Introduction: Patrick Schmidt is a notable inventor based in Brooklyn, NY (US). He has made significant contributions to the field of microscopy through his innovative designs and methods. His work focuses on enhancing the functionality and efficiency of microscopy systems.

Latest Patents: Patrick Schmidt holds a patent for an autofocus system and method. This microscopy system includes an objective, an imaging device, an illumination source, an epi-illumination module, and a controller. The imaging device captures a single image of a specimen positioned on the stage of the microscopy system. The illumination source is designed to illuminate the specimen effectively. The epi-illumination module features a focusing mechanism that is tilted in relation to a plane perpendicular to the primary optical path. The controller communicates with the illumination source and is configured to focus the microscopy system based on a pattern produced by the focusing mechanism on the captured image.

Career Highlights: Patrick Schmidt is currently employed at Nanotronics Imaging, Inc., where he continues to develop and refine his innovative microscopy technologies. His work has garnered attention for its potential to improve imaging techniques in various scientific fields.

Collaborations: Throughout his career, Patrick has collaborated with talented individuals such as Denis Y Sharoukhov and Tonislav Ivanov. These collaborations have contributed to the advancement of his projects and the overall success of his innovations.

Conclusion: Patrick Schmidt's contributions to microscopy through his patented autofocus system demonstrate his commitment to innovation and excellence in the field. His work continues to influence the way scientists and researchers utilize microscopy technology.