Saint Martin d'Heres, France

Patrick Scheer

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: STMicroelectronics. Active years: 2015.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Patrick Scheer - Innovator in Transistor Testing

Introduction

Patrick Scheer is a notable inventor based in Saint Martin d'Heres, France. He has made significant contributions to the field of electronics, particularly in the testing of transistors. His innovative approach has led to the development of a unique test structure that enhances the characterization of transistor properties.

Latest Patents

Patrick holds a patent for a "Transistor test structure." This invention includes a DC test structure for evaluating the direct current properties of transistors and an AC test structure for assessing alternating current properties. Notably, both the DC and AC test structures feature common test pads, which streamline the testing process.

Career Highlights

Patrick Scheer is currently employed at STMicroelectronics, a leading company in the semiconductor industry. His work at STMicroelectronics has allowed him to apply his expertise in transistor testing and contribute to advancements in electronic components.

Collaborations

Patrick collaborates with his coworker, Clement Charbuillet, to further enhance their research and development efforts in the field of electronics.

Conclusion

Patrick Scheer's innovative work in transistor testing exemplifies the importance of advancements in electronic testing methods. His contributions continue to influence the semiconductor industry positively.

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