This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Microscopy Gmbh. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Patrick Nagel: Innovator in Digital Microscopy
Introduction
Patrick Nagel is a notable inventor based in Reutlingen, Germany. He has made significant contributions to the field of digital microscopy, particularly through his innovative patent that enhances the calibration process of digital microscopes. His work is instrumental in improving the accuracy and reliability of imaging systems used in various scientific applications.
Latest Patents
Patrick Nagel holds a patent for a "Calibration plate for measuring calibration of a digital microscope and methods of using the same." This invention features a calibration plate that includes at least one calibration area with a surface structure comprising a plurality of grid cells arranged periodically. The design allows for the identification of boundaries and apexes of each grid cell by the optical imaging system of the digital microscope. This advancement not only streamlines the calibration process but also enhances the overall functionality of digital microscope systems.
Career Highlights
Patrick Nagel is associated with Carl Zeiss Microscopy GmbH, a leading company in the field of optical systems and microscopy. His role at the company has allowed him to work on cutting-edge technologies that push the boundaries of what is possible in digital imaging. With a focus on precision and innovation, he has contributed to the development of tools that are essential for researchers and professionals in various scientific disciplines.
Collaborations
Some of Patrick's notable coworkers include Zhongyu Li and Hailei Gu. Their collaborative efforts in the field of microscopy have led to advancements that benefit the scientific community.
Conclusion
Patrick Nagel's contributions to digital microscopy through his innovative patent demonstrate his commitment to enhancing scientific tools and methodologies. His work continues to impact the field positively, paving the way for future advancements in microscopy technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
