Hong Kong, China

Pat Lam Patrick Wong

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: City University of Hong Kong. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pat Lam Patrick Wong. Retrieved from https://idiyas.com/inventor/pat-lam-patrick-wong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Pat Lam Patrick Wong: Innovator in Analytical Methods

Introduction

Pat Lam Patrick Wong is a distinguished inventor based in Hong Kong, CN. He has made significant contributions to the field of analytical methods, particularly in determining the solution of objects under applied loads. His innovative approach has garnered attention in both academic and industrial circles.

Latest Patents

Pat Wong holds a patent for an "Analytical method of determining the solution of an object with edges under applied load." This analytical method involves several steps, including assigning the load applied on each of the object's planar surfaces in three-dimensional directions. It also includes determining the equivalent load from the applied loads with stress boundary conditions and calculating the stress and strain fields from the equivalent load.

Career Highlights

Pat Wong is affiliated with the City University of Hong Kong, where he continues to advance his research and innovation. His work has been instrumental in enhancing the understanding of stress and strain in various engineering applications.

Collaborations

Some of his notable coworkers include Liang Guo and Zhiming Zhang, who have collaborated with him on various projects, contributing to the advancement of their shared field.

Conclusion

Pat Lam Patrick Wong's contributions to analytical methods demonstrate his commitment to innovation and excellence in engineering. His work continues to influence the field and inspire future research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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