The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Jan. 19, 2018
Applicant:

City University of Hong Kong, Kowloon, HK;

Inventors:

Liang Guo, Qufu, CN;

Zhiming Zhang, Shanghai, CN;

Wen Wang, Shanghai, CN;

Pat Lam Patrick Wong, Kowloon, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/32 (2006.01); G06F 17/16 (2006.01); G01L 1/00 (2006.01); G06F 30/00 (2020.01);
U.S. Cl.
CPC ...
G01B 21/32 (2013.01); G01L 1/005 (2013.01); G06F 17/16 (2013.01); G06F 30/00 (2020.01);
Abstract

An analytical method of determining the solution of an object with a plurality of planar surfaces under applied load includes the steps of assigning the load applied on each of the plurality of planar surfaces in the three dimensional directions respectively, determining the equivalent load applied on each of the plurality of planar surfaces in the three dimensional directions from the applied loads with the stress boundary conditions, and determining the stress and strain fields from the equivalent load applied on each of the plurality of planar surfaces.


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