Karlsruhe, Germany

Pascal Maier

This inventor holds 1 USPTO granted patent and 2 published patent applications and 2 EPO patents. Top assignee: Karlsruher Institut Für Technologie. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pascal Maier. Retrieved from https://idiyas.com/inventor/pascal-maier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pascal Maier - Innovator in Electrical Connector Assembly

Introduction

Pascal Maier is an inventor based in Ulm, Germany. He has made significant contributions to the field of electrical connector assembly. Although he currently holds no granted patents, his work in this area is noteworthy.

Latest Patent Applications

Pascal Maier has submitted several patent applications, including:

1. **Device and Method for Assembling a Plug Connector** - This invention relates to a device for assembling a plug connector on a front end portion of at least one first cable. The device features a first holding element designed to pivot about the front end portion of the first cable.

2. **Device, Method and System for Assembly of an Electrical Plug Connector** - This invention involves a device designed to press a forward end of an electrical cable into a corresponding plug-in point of a housing assembly of the plug connector. The device includes an optical sensor unit to detect the actual position of the inner conductor contact element within the housing assembly while the cable is being pressed in.

Conclusion

Pascal Maier's innovative work in electrical connector assembly showcases his dedication to advancing technology in this field. His latest patent applications reflect his commitment to developing practical solutions for electrical connections.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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