Bengaluru, India

Parekh Jigar Prakashbhai

This inventor holds 1 USPTO granted patent. Top assignee: Cadence Design Systems, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Parekh Jigar Prakashbhai. Retrieved from https://idiyas.com/inventor/parekh-jigar-prakashbhai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Parekh Jigar Prakashbhai: Patent Inventor in Bengaluru

Introduction

Parekh Jigar Prakashbhai is an inventor based in Bengaluru, India, associated with Cadence Design Systems, Inc. His patent work addresses testing methods for data transmission.

Latest Patents

The available information lists one patent for Parekh: “Eye Width Sweep Test for Use in Data Transmission.” The invention describes systems and methods for performing an eye-width sweep test associated with a transmission protocol. It includes initiating data-to-clock training across all lanes, comparing an incoming signal with an expected signal at the receiver, and sending a pass-or-fail result back to the transmitter. The method also analyzes all possible passing ranges within a single full eye width. Parekh is credited with 1 patent.

Career Highlights

Parekh’s listed patent reflects work on evaluating signal timing and transmission performance. His association with Cadence Design Systems connects his invention to the broader field of electronic design and data-transmission technologies.

Collaborations

The provided information names Satish Kumar Ambati and Vikas Kumar Agrawal as Parekh’s coworkers. It does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Parekh Jigar Prakashbhai’s listed patent focuses on a systematic eye-width sweep test for assessing data transmission, highlighting his contribution to signal testing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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