Company Filing History:
Years Active: 2020-2021
Title: The Innovations of Paramjit S Banwait
Introduction
Paramjit S Banwait is a notable inventor based in Fremont, CA. He has made significant contributions to the field of integrated circuits and radio frequency technology. With a total of 2 patents, his work focuses on advancing testing methods for millimeter wave integrated circuits.
Latest Patents
Paramjit S Banwait's latest patents include innovative methods for over-the-air testing of millimeter wave integrated circuits with integrated antennas. This patent describes testing devices such as integrated circuits (IC) with antennas configured for millimeter wave (mmW) transmission and reception. The device under test (DUT) can be mounted to an interface in a measurement fixture, allowing for comprehensive testing of power and data connections. Additionally, the radio frequency (RF) characteristics of the DUT can be evaluated over-the-air using an array of antennas or probes, incorporating power detectors to measure the RF radiating pattern.
Another significant patent is the over-the-air test fixture using an antenna array. This invention presents a system and method for rapidly and cost-effectively testing devices with antennas configured for RF and mmW transmission and reception. The DUT is mounted to an interface in a measurement fixture, enabling thorough testing of its RF characteristics over-the-air.
Career Highlights
Paramjit S Banwait is currently employed at National Instruments Corporation, where he continues to innovate in the field of testing technologies. His work has contributed to the advancement of integrated circuit testing methodologies, enhancing the efficiency and accuracy of RF measurements.
Collaborations
Throughout his career, Paramjit has collaborated with talented individuals such as Marcus K DaSilva and Chen Chang. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Paramjit S Banwait is a distinguished inventor whose work in integrated circuits and RF technology has led to significant advancements in testing methodologies. His contributions continue to shape the future of technology in this field.