The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Oct. 23, 2018
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

Marcus K. DaSilva, Oak Grove, OR (US);

Chen Chang, Fremont, CA (US);

Charles G. Schroeder, Cedar Park, TX (US);

Ahsan Aziz, Austin, TX (US);

Paramjit S. Banwait, Fremont, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/27 (2015.01); H04B 17/17 (2015.01); H04B 17/336 (2015.01); H01Q 3/26 (2006.01); G01R 1/04 (2006.01); G01R 31/28 (2006.01); G01R 31/319 (2006.01); H04B 17/12 (2015.01);
U.S. Cl.
CPC ...
H04B 17/17 (2015.01); G01R 1/045 (2013.01); G01R 31/2856 (2013.01); G01R 31/2884 (2013.01); G01R 31/31905 (2013.01); H01Q 3/267 (2013.01); H04B 17/27 (2015.01); H04B 17/336 (2015.01); H04B 17/12 (2015.01);
Abstract

Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections (e.g., wired) for input/output signals, power, and control and may also provide positioning. Radio frequency (RF) characteristics of the DUT may be tested over-the-air using an array of antennas or probes in the radiating Fresnel zone of the DUT's antennas. Each of the antennas or probes of the array may incorporate a power detector (e.g., a diode) so that the RF radiating pattern may be measured using DC voltage measurements. Measured voltage measurements may be compared to an ideal signature, e.g., voltage measurements expected from an ideal or model DUT.


Find Patent Forward Citations

Loading…