The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Nov. 02, 2018
National Instruments Corporation, Austin, TX (US);
Marcus K. DaSilva, Oak Grove, OR (US);
Chen Chang, Fremont, CA (US);
Charles G. Schroeder, Cedar Park, TX (US);
Ahsan Aziz, Austin, TX (US);
Paramjit S. Banwait, Fremont, CA (US);
National Instruments Corporation, Austin, TX (US);
Abstract
Various embodiments are presented of a system and method for testing (e.g., rapidly and cheaply) devices with antennas configured for radio frequency (RF) and/or millimeter wave (mmW) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections for input/output signals, power, and control and may also provide positioning. RF characteristics (e.g., including transmission, reception, and/or beamforming) of the DUT may be tested over-the-air using an array of antennas or probes.