Rehovot, Israel

Osip Schwartz

This inventor holds 1 USPTO granted patent. Top assignee: Yeda Research and Development Co. Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Osip Schwartz. Retrieved from https://idiyas.com/inventor/osip-schwartz-ogdgpq0j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Osip Schwartz and Laser-Based Contrast Control in Electron Microscopy.

Introduction

Osip Schwartz is an inventor associated with Rehovot, Israel, and Yeda Research and Development Co. Ltd. His work includes an invention designed to control contrast in transmission electron microscopy using laser-based techniques.

Latest Patents

Schwartz is associated with 1 patent: “Laser-Based Contrast Control in Transmission Electron Microscopy.” The patent describes a system and methods for electron-beam imaging or spectroscopy. It combines a transmission electron microscope, one or more laser-based devices that shift a selected portion of an electron wave to a different energy, and an electron energy filter that accepts electrons at the source energy while rejecting those shifted by the laser device. This approach is intended to provide a means of controlling contrast in electron microscopy.

Career Highlights

Schwartz’s listed patent reflects work at the intersection of electron microscopy and laser-based control of electron waves. He is associated with Yeda Research and Development Co. Ltd., which supports the development and commercialization of research-based technologies.

Collaborations

Schwartz’s listed coworker is Michael Kali. Their association connects Schwartz’s inventive work with colleagues involved in research and development.

Conclusion

Osip Schwartz’s patent presents a laser-based approach to contrast control in transmission electron microscopy, highlighting his contribution to imaging and spectroscopy technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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