The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Nov. 01, 2022
Applicant:

Yeda Research and Development Co. Ltd., Rehovot, IL;

Inventors:

Osip Schwartz, Rehovot, IL;

Michael Kali, Rehovot, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/22 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/226 (2013.01); H01J 37/263 (2013.01); H01J 2237/057 (2013.01); H01J 2237/24485 (2013.01); H01J 2237/2614 (2013.01);
Abstract

A system and methods for electron beam imaging or electron beam spectroscopy. The system comprising: a transmission electron microscope (TEM) having a back focal plane; one or more laser-based devices, configured to shift a predetermined portion of an electron wave to an energy that is different from the energy originally provided by the electron source of the TEM; and an electron energy filter that is configured to accept electron waves, at the energy provided by the electron source of the TEM, and further configured to reject electron waves shifted to a different energy by the laser device.


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Schwartz, Osip. (2026). Laser-based contrast control in transmission electron microscopy (U.S. Patent No. 12738449). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12738449

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