Tel Aviv, Israel

Ori Gonen


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: **Innovator Ori Gonen: Pioneering Image Splitting Technologies in Optical Inspection**

Introduction

Ori Gonen, an innovative inventor based in Tel Aviv, Israel, has made significant strides in the field of optical inspection systems. With one patent to his name, Gonen has brought a new approach to image processing, particularly for inspecting semiconductor wafers.

Latest Patents

Gonen's patent, titled "Image Splitting in Optical Inspection Systems," presents a groundbreaking technique where an image of an object, such as a semiconductor wafer, is obtained through advanced imaging optics defining a focal plane. This invention involves splitting the image into multiple portions, enabling detection by various detectors that each register a part of the image. Utilizing polarization-based beam splitters and specialized lenses positioned tangent to the focal plane, his invention efficiently divides light into rectangular segments. Notably, Gonen's design employs a pair of arrays of half-cylinder lenses with their flat sides facing each other, allowing for precise division without the non-uniformities typically associated with spherical lenses in a rectangular configuration.

Career Highlights

Ori Gonen currently works at Applied Materials South East Asia Pte. Ltd., where he continues to contribute to advancements in optical technologies. His focus on refining inspection processes plays a critical role in enhancing the reliability and efficiency of semiconductor manufacturing.

Collaborations

Throughout his career, Gonen has collaborated with esteemed colleagues such as Dov Furman and Roy Kaner. These partnerships highlight a team-oriented approach to innovation, fostering an environment where ideas can flourish and lead to groundbreaking developments.

Conclusion

Ori Gonen’s contributions to the field of optical inspection through his innovative patent reflect a dedication to improving technology in semiconductor applications. His work not only enhances the precision of inspections but also sets a foundation for further advancements in optical systems, showcasing the vital role of inventors in technological progress.

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