Company Filing History:
Years Active: 2020-2024
Title: Ola El Bakry: Innovator in X-Ray Scanning Technology
Introduction
Ola El Bakry is a distinguished inventor based in St-Laurent, Canada. He has made significant contributions to the field of x-ray scanning technology, holding a total of six patents. His innovative methods and devices have advanced the capabilities of x-ray scanning systems, enhancing their accuracy and efficiency.
Latest Patents
Among his latest patents is a calibration method and device for determining geometric properties of x-ray scanning systems. This method involves positioning a calibration device within the scanning chamber, measuring distances, and scanning the device to produce an image. The process identifies pixels representing geometric features and determines the position and orientation of these pixels to ascertain scanning system properties. Another notable patent focuses on assigning attributes to x-ray attenuation. This method involves scanning reference materials with known compositions and dimensions, detecting x-rays, and generating dual-energy attenuation images to define attenuation surfaces.
Career Highlights
Ola has worked with several prominent companies, including Voti Inc. and Rapiscan Holdings, Inc. His experience in these organizations has allowed him to apply his innovative ideas in practical settings, contributing to advancements in security and imaging technologies.
Collaborations
Ola has collaborated with notable professionals in his field, including Emmanuel St-Aubin and Philippe Desjeans-Gauthier. These collaborations have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Ola El Bakry's contributions to x-ray scanning technology exemplify his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving the accuracy and functionality of scanning systems, making a lasting impact on the industry.