The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Dec. 21, 2018
Voti Inc., St-Laurent, Quebec, CA;
Emmanuel St-Aubin, St-Laurent, CA;
Philippe Desjeans-Gauthier, St-Laurent, CA;
Ola El Bakry, St-Laurent, CA;
Simon Archambault, St-Laurent, CA;
William Awad, St-Laurent, CA;
VOTI INC., Quebec, CA;
Abstract
There is provided a method for assigning an attribute to x-ray attenuation including the steps of acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information, acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information, and, joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths.