Ok-Sun Lee

Title: The Innovations of Ok-Sun Lee

Introduction

Ok-Sun Lee is a notable inventor based in Gyeonggi-do, South Korea. She has made significant contributions to the field of contamination analysis, particularly in the semiconductor industry. Her work is recognized for its impact on improving cleaning processes and ensuring the quality of inspection objects.

Latest Patents

Ok-Sun Lee holds a patent for a "Contamination analysis unit and method thereof, and reticle cleaning system." This invention provides a method for inspecting pollutants that remain on the target side of an inspection object, such as a reticle, after cleaning. The process involves steeping the target side in a solution, allowing for the abstraction of a sampling liquid after a predetermined time, which can then be analyzed for contaminants. This innovation is crucial for maintaining the integrity of semiconductor manufacturing processes.

Career Highlights

Ok-Sun Lee is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. Her role involves research and development in contamination analysis, where she applies her expertise to enhance cleaning systems and inspection methodologies. Her contributions have been instrumental in advancing the company's technological capabilities.

Collaborations

Throughout her career, Ok-Sun Lee has collaborated with talented individuals such as Hyung-Seok Choi and Yo-Han Ahn. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Ok-Sun Lee's work exemplifies the importance of innovation in the semiconductor industry. Her patent and contributions to contamination analysis highlight her role as a key inventor in this field. Her efforts continue to influence the quality and efficiency of semiconductor manufacturing processes.