This inventor holds 2 USPTO granted patents. Top assignee: Korea Institute of Machinery & Materials. Active years: 2014-2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014-2018
Title: Oh Won Kwon: Innovations in Ion Measurement and Nucleic Acid Analysis.
Introduction
Oh Won Kwon is an inventor based in Daejeon, South Korea. His work includes inventions for measuring ion concentrations and automatically analyzing nucleic acids. He is associated with the Korea Institute of Machinery & Materials and has 2 patents.
Latest Patents
- **Ion concentration measuring method and apparatus.** This invention measures ion concentration using an ion-sensing layer in contact with a solution and multiple transistors whose gate electrodes connect to that layer. A reading unit uses the transistors’ drain currents to change frequency information and generate ion concentration information.
- **Device for automatically analyzing nucleic acid.** This apparatus combines a sample-preprocessing device with a nucleic-acid amplification and detection device. Multiple chambers hold reagents that are mixed with a sample in sequence to extract nucleic acid, which is then transferred for amplification and detection.
Career Highlights
Kwon’s listed inventions address measurement and laboratory analysis technologies. His work at the Korea Institute of Machinery & Materials is associated with these patent contributions.
Collaborations
Kang-Ho Lee and Dong Kyu Lee are identified as Kwon’s coworkers.
Conclusion
Oh Won Kwon’s patents cover technologies for ion concentration measurement and automated nucleic acid analysis, reflecting his contributions to scientific instrumentation and sample-processing systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile