The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Dec. 04, 2015
Applicant:
Korea Institute of Machinery & Materials, Daejeon, KR;
Inventors:
Kang-Ho Lee, Daejeon, KR;
Oh Won Kwon, Daejeon, KR;
Bong Seop Kwak, Daejeon, KR;
Dong Kyu Lee, Daejeon, KR;
Assignee:
KOREA INSTITUTE OF MACHINERY & MATERIALS, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01N 27/414 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4145 (2013.01);
Abstract
An ion concentration measuring method and apparatus are provided. The ion concentration measuring apparatus includes an ion sensing layer in contact with a solution, a plurality of transistors having gate electrodes connected to the ion sensing layer, and a reading unit configured to change frequency information by using drain currents from the plurality of transistors and generate ion concentration information by using the frequency information.