Singapore, Singapore

Oh Tiong Keng


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Oh Tiong Keng in Strain Measurement Technology.

Introduction

Oh Tiong Keng is a notable inventor based in Singapore, recognized for his contributions to the field of strain measurement technology. He has developed a unique system that enhances the accuracy and efficiency of measuring strain in various specimens. His innovative approach combines advanced imaging techniques with sophisticated light modulation.

Latest Patents

Oh Tiong Keng holds a patent for a "Real-time multi-point diffraction-based imaging system for strain measurement." This invention relates to a system and a method for measuring strain of a specimen on a strain measurement system. The system includes an image capturing device, a spatial light modulator, a first light source, a second light source, and a beam switching controller. It receives parameters from user input and generates a lenslet pattern to be transmitted to the spatial light modulator. The system alternates between the first and second light sources and activates the image capturing device to capture images. Based on the images received, the system optimizes the image capturing device for improved performance.

Career Highlights

Oh Tiong Keng is affiliated with Nanyang Polytechnic, where he contributes to research and development in the field of imaging systems. His work has significantly impacted the way strain measurements are conducted, providing more reliable data for various applications.

Collaborations

Oh Tiong Keng collaborates with colleagues such as Koh Wing Onn and Zhu Hui, who share his passion for innovation and research in imaging technologies.

Conclusion

Oh Tiong Keng's contributions to strain measurement technology exemplify the importance of innovation in scientific research. His patented system represents a significant advancement in the field, showcasing his dedication to improving measurement techniques.

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