Moshav Amirim, Israel

Ofir Keren


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2012-2013

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2 patents (USPTO):Explore Patents

Title: Ofir Keren: Innovator in Memory Testing Technology

Introduction

Ofir Keren is a notable inventor based in Moshav Amirim, Israel. He has made significant contributions to the field of integrated circuits, particularly in memory testing technology. With a total of 2 patents to his name, Keren's work is recognized for its innovative approaches to enhancing memory testing processes.

Latest Patents

Ofir Keren's latest patents include a method and apparatus for memory testing. The first patent describes an integrated circuit that features a scrambler designed to provide a driving address and associated data to an envelope based on a memory configuration for utilizing a memory array. This technology is crucial for testing the memory array according to a specific test pattern. The second patent also focuses on memory testing, detailing an integrated circuit configured for parallel memory testing. This circuit includes multiple memory blocks and scramblers that work together to translate driving addresses into corresponding physical addresses, thereby facilitating efficient memory testing.

Career Highlights

Keren is currently employed at Marvell Israel Ltd., where he continues to develop innovative solutions in the field of memory technology. His work at Marvell has allowed him to collaborate with other talented professionals and contribute to advancements in integrated circuit design.

Collaborations

Ofir Keren has worked alongside his coworker, Yosef Solt, in various projects aimed at improving memory testing methodologies. Their collaboration has led to the development of cutting-edge technologies that enhance the efficiency and accuracy of memory testing processes.

Conclusion

Ofir Keren's contributions to memory testing technology through his patents and work at Marvell Israel Ltd. highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of integrated circuits and memory testing.

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