Haifa, Israel

Oded Meirav


Average Co-Inventor Count = 3.9

ph-index = 7

Forward Citations = 295(Granted Patents)


Company Filing History:


Years Active: 2007-2012

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10 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Oded Meirav

Introduction

Oded Meirav is a prominent inventor based in Haifa, Israel. He has made significant contributions to the field of x-ray imaging technology. With a total of 10 patents to his name, Meirav's work has had a substantial impact on medical imaging practices.

Latest Patents

One of his latest inventions is the x-ray flux management device. This innovative device adaptively attenuates an x-ray beam to limit the incident flux reaching a subject and radiographic detectors in potentially high-flux areas. It ensures that the incident flux and detector measurements in low-flux regions remain unaffected. While particularly well-suited for computed tomography (CT), this invention is also applicable to other x-ray imaging systems. In addition to reducing the required detector system dynamic range, it provides the added advantage of reducing radiation dose.

Career Highlights

Oded Meirav is associated with General Electric Company, where he continues to develop groundbreaking technologies. His work has been instrumental in enhancing the safety and effectiveness of x-ray imaging.

Collaborations

Throughout his career, Meirav has collaborated with notable colleagues, including Jerome Stephen Arenson and David Ruimi. These partnerships have fostered innovation and contributed to the advancement of medical imaging technologies.

Conclusion

Oded Meirav's contributions to x-ray imaging technology exemplify the importance of innovation in healthcare. His inventions not only improve imaging techniques but also enhance patient safety through reduced radiation exposure.

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