The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Oct. 12, 2007
Applicants:

Jerome Stephen Arenson, Haifa, IL;

David Ruimi, Netanya, IL;

Oded Meirav, Haifa, IL;

Robert Harry Armstrong, Waukesha, WI (US);

Inventors:

Jerome Stephen Arenson, Haifa, IL;

David Ruimi, Netanya, IL;

Oded Meirav, Haifa, IL;

Robert Harry Armstrong, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 3/00 (2006.01); G21K 1/04 (2006.01); G01D 5/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is directed to an x-ray flux management device that adaptively attenuates an x-ray beam to limit the incident flux reaching a subject and radiographic detectors in potentially high-flux areas while not affecting the incident flux and detector measurements in low-flux regions. While the invention is particularly well-suited for CT, the invention is also applicable with other x-ray imaging systems. In addition to reducing the required detector system dynamic range, the present invention provides an added advantage of reducing radiation dose.


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