The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Nov. 18, 2004
Applicants:

Jerome Stephen Arenson, Haifa, IL;

David Ruimi, Netanya, IL;

Oded Meirav, Haifa, IL;

Robert Harry Armstrong, Waukesha, WI (US);

Inventors:

Jerome Stephen Arenson, Haifa, IL;

David Ruimi, Netanya, IL;

Oded Meirav, Haifa, IL;

Robert Harry Armstrong, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/26 (2006.01); G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for controlling an X-ray imaging system. The method for controlling an X-ray imaging system includes acquiring a plurality of subviews of patient attenuation data wherein a first set of subviews of patient attenuation data is acquired at a first radiation flux level and a second set of subviews of patient attenuation data is acquired at a second radiation flux level. The first radiation flux level is different than the second radiation flux level. The method further includes combining the first set of subviews of patient attenuation data and the second set of subviews of patient attenuation data to form corrected views for subsequent image generation.


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