This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ay Dee Kay LLC. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Oded Katz: Inventor of Functional Safety Testing Technology.
Introduction
Oded Katz is an inventor based in Aliso Viejo, California. His work includes an integrated-circuit approach to testing circuit sub-blocks, and he is associated with Ay Dee Kay LLC. He holds 1 patent.
Latest Patents
Katz’s patent, “Phase-shifter functional safety testing,” describes an integrated circuit that tests a circuit sub-block implemented with analog and digital components. Rather than testing the sub-block’s overall function, the approach tests its individual components independently, including both analog and digital components. The patent describes applications that include functional safety testing.
Career Highlights
Katz’s patent work addresses testing methods for mixed analog-and-digital integrated circuits. The described approach focuses on evaluating individual components within a circuit sub-block.
Collaborations
Katz’s listed coworkers include Tom Heller and Danny Elad. His company affiliation is Ay Dee Kay LLC.
Conclusion
Oded Katz’s patent describes an approach to functional safety testing that evaluates analog and digital components independently within an integrated circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile