The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Nov. 27, 2023
Applicant:

Aydeekay Llc, Aliso Viejo, CA (US);

Inventors:

Tom Heller, Aliso Viejo, CA (US);

Danny Elad, Aliso Viejo, CA (US);

Benny Sheinman, Aliso Viejo, CA (US);

Oded Katz, Aliso Viejo, CA (US);

Assignee:

AyDeeKay LLC, Aliso Viejo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3167 (2006.01); G01S 13/931 (2020.01);
U.S. Cl.
CPC ...
G01R 31/3167 (2013.01); G01S 13/931 (2013.01);
Abstract

An integrated circuit that performs testing of a circuit sub-block is described. This integrated circuit may include the circuit sub-block that performs a function, where the circuit sub-block is implemented in an analog domain using analog components and in a digital domain using digital components. Moreover, the integrated circuit may perform the testing of the circuit sub-block using independent testing of individual components in the circuit sub-block instead of testing the function of the circuit sub-block as a whole. Note that the individual components include the analog components and the digital components. In some embodiments, the testing may include functional safety testing.


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