Oanh Nguyen

Title: Oanh Nguyen: Innovator in Non-Contact Measurement Technologies

Introduction

Oanh Nguyen is a prominent inventor based in Union City, CA (US), known for her contributions to the field of non-contact measurement technologies. With a total of three patents to her name, she has made significant advancements in measuring stress in thin films deposited on substrates. Her innovative methods have the potential to enhance various applications in materials science and engineering.

Latest Patents

One of Oanh Nguyen's latest patents focuses on a method for non-contact measurement of stress in a thin film on a substrate. This method involves measuring first topography data of a substrate that has a thin film deposited on it. It also includes comparing this data with second topography data obtained prior to the thin film's deposition. By analyzing the differences, the method allows for the determination of vertical displacement of the substrate. Furthermore, it enables the detection of stress values in the thin film using a fourth-order polynomial equation in conjunction with the vertical displacement.

Career Highlights

Throughout her career, Oanh Nguyen has worked with notable companies such as Applejack 199 L.P. and Vactronix Scientific, LLC. Her experience in these organizations has contributed to her expertise in the field of measurement technologies and has facilitated her innovative work.

Collaborations

Oanh has collaborated with talented individuals in her field, including Wojciech Jan Walecki and Tianzong Xu. These collaborations have likely enriched her research and development efforts, leading to her successful patent applications.

Conclusion

Oanh Nguyen's work in non-contact measurement technologies exemplifies her innovative spirit and dedication to advancing scientific knowledge. Her patents reflect her commitment to improving measurement techniques, which can have a lasting impact on various industries.